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U.S. Department of Energy
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Pressure cryocooling protein crystals

Patent ·
OSTI ID:1029280

Preparation of cryocooled protein crystal is provided by use of helium pressurizing and cryocooling to obtain cryocooled protein crystal allowing collection of high resolution data and by heavier noble gas (krypton or xenon) binding followed by helium pressurizing and cryocooling to obtain cryocooled protein crystal for collection of high resolution data and SAD phasing simultaneously. The helium pressurizing is carried out on crystal coated to prevent dehydration or on crystal grown in aqueous solution in a capillary.

Research Organization:
Cornell University
Sponsoring Organization:
USDOE
DOE Contract Number:
FG02-97ER62443
Assignee:
Cornell Research Foundation, Inc. (Ithaca, NY)
Patent Number(s):
8,030,449
Application Number:
11/700,237
OSTI ID:
1029280
Country of Publication:
United States
Language:
English

References (14)

Crystallizing a Protein book January 1994
Use of Noble Gases Xenon and Krypton as Heavy Atoms in Protein Structure Determination book January 2003
Models of protein crystal growth journal June 2001
Probing Substates in Sperm Whale Myoglobin Using High-Pressure Crystallography journal January 2002
The RCK Domain of the KtrAB K+ Transporter: Multiple Conformations of an Octameric Ring journal September 2006
Protein recognition of macrocycles: Binding of anti-HIV metallocyclams to lysozyme journal February 2005
Freezing of myoglobin crystals at high pressure journal May 1973
MAD phasing with krypton journal February 2001
High-pressure cooling of protein crystals without cryoprotectants journal June 2005
Crystal growth in X-ray-transparent plastic tubing: an alternative for high-throughput applications journal October 2005
Solution of protein crystallographic structures by high-pressure cryocooling and noble-gas phasing journal June 2006
Crystallogenesis of biological macromolecules: facts and perspectives journal July 1994
New Strategies for Protein Crystal Growth journal August 1999
Simple Helium Enclosure for Increasing Diffraction-Line Detectability with a G.E. XRD-5 Diffractometer journal May 1968

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