Continuous spin reorientation transition in epitaxially grown antiferromagnetic NiO thin films
Journal Article
·
· Physical Review. B, Condensed Matter and Materials Physics
Fe/NiO/MgO/Ag(001) films were grown epitaxially, and the Fe and NiO spin orientations were determined using x-ray magnetic dichroism. We find that the NiO spins are aligned perpendicularly to the in-plane Fe spins. Analyzing both the in-plane and out-of-plane spin components of the NiO layer, we demonstrate unambiguously that the antiferromagnetic NiO spins undergo a continuous spin reorientation transition from the in-plane to out-of-plane directions with increasing of the MgO thickness.
- Research Organization:
- Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA (US)
- Sponsoring Organization:
- Advanced Light Source Division; Materials Sciences Division
- DOE Contract Number:
- AC02-05CH11231
- OSTI ID:
- 1026807
- Report Number(s):
- LBNL-4912E
- Journal Information:
- Physical Review. B, Condensed Matter and Materials Physics, Journal Name: Physical Review. B, Condensed Matter and Materials Physics Journal Issue: 1 Vol. 84; ISSN 1098-0121
- Country of Publication:
- United States
- Language:
- English
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