Continuous spin reorientation transition in epitaxially grown antiferromagnetic NiO thin films
Abstract
Fe/NiO/MgO/Ag(001) films were grown epitaxially, and the Fe and NiO spin orientations were determined using x-ray magnetic dichroism. We find that the NiO spins are aligned perpendicularly to the in-plane Fe spins. Analyzing both the in-plane and out-of-plane spin components of the NiO layer, we demonstrate unambiguously that the antiferromagnetic NiO spins undergo a continuous spin reorientation transition from the in-plane to out-of-plane directions with increasing of the MgO thickness.
- Authors:
- Publication Date:
- Research Org.:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Org.:
- Advanced Light Source Division; Materials Sciences Division
- OSTI Identifier:
- 1026807
- Report Number(s):
- LBNL-4912E
Journal ID: ISSN 1098-0121; TRN: US1105135
- DOE Contract Number:
- DE-AC02-05CH11231
- Resource Type:
- Journal Article
- Journal Name:
- Physical Review. B, Condensed Matter and Materials Physics
- Additional Journal Information:
- Journal Volume: 84; Journal Issue: 1; Journal ID: ISSN 1098-0121
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; DICHROISM; EPITAXY; SPIN; SPIN ORIENTATION; THICKNESS; THIN FILMS
Citation Formats
Li, J, Arenholz, E, Meng, Y, Tan, A, Park, J, Jin, E, Son, H, Wu, J, Jenkins, C A, Scholl, A, Hwang, Chanyong, and Qiu, Z Q. Continuous spin reorientation transition in epitaxially grown antiferromagnetic NiO thin films. United States: N. p., 2011.
Web. doi:10.1103/PhysRevB.84.012406.
Li, J, Arenholz, E, Meng, Y, Tan, A, Park, J, Jin, E, Son, H, Wu, J, Jenkins, C A, Scholl, A, Hwang, Chanyong, & Qiu, Z Q. Continuous spin reorientation transition in epitaxially grown antiferromagnetic NiO thin films. United States. https://doi.org/10.1103/PhysRevB.84.012406
Li, J, Arenholz, E, Meng, Y, Tan, A, Park, J, Jin, E, Son, H, Wu, J, Jenkins, C A, Scholl, A, Hwang, Chanyong, and Qiu, Z Q. 2011.
"Continuous spin reorientation transition in epitaxially grown antiferromagnetic NiO thin films". United States. https://doi.org/10.1103/PhysRevB.84.012406. https://www.osti.gov/servlets/purl/1026807.
@article{osti_1026807,
title = {Continuous spin reorientation transition in epitaxially grown antiferromagnetic NiO thin films},
author = {Li, J and Arenholz, E and Meng, Y and Tan, A and Park, J and Jin, E and Son, H and Wu, J and Jenkins, C A and Scholl, A and Hwang, Chanyong and Qiu, Z Q},
abstractNote = {Fe/NiO/MgO/Ag(001) films were grown epitaxially, and the Fe and NiO spin orientations were determined using x-ray magnetic dichroism. We find that the NiO spins are aligned perpendicularly to the in-plane Fe spins. Analyzing both the in-plane and out-of-plane spin components of the NiO layer, we demonstrate unambiguously that the antiferromagnetic NiO spins undergo a continuous spin reorientation transition from the in-plane to out-of-plane directions with increasing of the MgO thickness.},
doi = {10.1103/PhysRevB.84.012406},
url = {https://www.osti.gov/biblio/1026807},
journal = {Physical Review. B, Condensed Matter and Materials Physics},
issn = {1098-0121},
number = 1,
volume = 84,
place = {United States},
year = {Tue Mar 01 00:00:00 EST 2011},
month = {Tue Mar 01 00:00:00 EST 2011}
}
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