Ultrathin Silver Films on Ni(111)

Journal Article · Fri Jan 01 04:00:00 EST 2010 · Physical Review B: Condensed Matter and Materials Physics

DOI:https://doi.org/10.1103/PhysRevB.82.085424· OSTI ID:1020027

Meyer, A; Flege, J; Rettew, R; Senanayake, S; Schmidt, T; Alamgir, F; Falta, J

The growth and atomic structure of ultrathin silver films on Ni(111) was investigated by low-energy electron microscopy and diffraction (LEEM/LEED) as well as intensity-voltage [I(V)]-LEEM in the growth temperature range between 470 and 850 K. We find that silver grows in a Stranski-Krastanov mode with a two monolayer thin wetting layer which takes on a p(7 x 7) reconstruction at temperatures lower than 700 K and a ({radical}52 x {radical}52)R13.9{sup o} reconstruction at higher temperatures. The occurrence of the two distinct reconstructions is shown to have profound implications for the growth characteristics of films exhibiting thicknesses of one and two monolayers. The nanoscale I(V) characteristics of the films were analyzed by means of multiple-scattering calculations based on dynamical LEED theory. Furthermore, the vertical interatomic spacing at the interface between the Ag film and the Ni substrate was determined to (2.8 {+-} 0.1) {angstrom} for all film thicknesses (<13 ML) while the uppermost silver layer relaxes by about (4 {+-} 1)% toward the crystal.

• Research Organization: Brookhaven National Laboratory (BNL) National Synchrotron Light Source
• Sponsoring Organization: DOE - OFFICE OF SCIENCE
• DOE Contract Number: AC02-98CH10886
• OSTI ID: 1020027
• Report Number(s): BNL--95873-2011-JA
• Journal Information: Physical Review B: Condensed Matter and Materials Physics, Journal Name: Physical Review B: Condensed Matter and Materials Physics Journal Issue: 8 Vol. 82
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
DIFFRACTION
ELECTRON MICROSCOPY
MULTIPLE SCATTERING
SILVER
SUBSTRATES
national synchrotron light source