Evolution of oxidation and creep damage mechanisms in HIPed silicon nitride materials
Conference
·
OSTI ID:10189104
Several yttria-fluxed, hot-isostatically pressed (HIPed) silicon nitrides have been tensile creep tested at temperatures representative of gas turbine engines. Creep and oxidation assisted damage mechanisms concurrently evolve when these materials are tested at high temperatures and low stresses (i.e., long exposure times at temperature). Atmospheric creep testing results in creation of oxygen and yttrium gradients across the radial dimension. High concentrations of oxygen and yttrium coincide with dense populations of lenticular-shaped cavities near the surface of crept specimens. The center of the tensile specimens was devoid of oxygen or yttrium; in addition, lenticular cavities were rare. The gradient in lenticular-cavity concentration is coincident with the oxygen and yttrium gradients. Stress corrosion cracking (SCC) also occurs in these HIPed silicon nitrides when they are subjected to stress at high temperatures in ambient air. The size of this damage zone increases when the temperature is higher and/or the applied stress is lower. Stress-corrosion cracking initiates at the surface of the tensile specimen and advances radially inwards. What nucleates SCC has not yet been identified, but it is believed to result from a stress-concentrator (e.g., machining damage) at the surface and its growth is a result of coalescence of microcracks and cavities. The higher concentration of oxygen and yttrium in the grain boundaries near the specimen`s surface lessens the local high temperature mechanical integrity; this is believed to be associated with the growth of the SCC zone. This SCC zone continues to grow in size during tensile loading until it reaches a critical size which causes fracture.
- Research Organization:
- Oak Ridge National Lab., TN (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC05-84OR21400
- OSTI ID:
- 10189104
- Report Number(s):
- CONF-940865--4; ON: DE95001360
- Country of Publication:
- United States
- Language:
- English
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