High spatial resolution X-ray and gamma ray imaging system using diffraction crystals
Patent
·
OSTI ID:1018042
- Hinsdale, IL
A method and a device for high spatial resolution imaging of a plurality of sources of x-ray and gamma-ray radiation are provided. The device comprises a plurality of arrays, with each array comprising a plurality of elements comprising a first collimator, a diffracting crystal, a second collimator, and a detector.
- Research Organization:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC02-06CH11357
- Assignee:
- Uchicago Argonne, LLC (Chicago, IL)
- Patent Number(s):
- 7,943,906
- Application Number:
- 12/272,483
- OSTI ID:
- 1018042
- Country of Publication:
- United States
- Language:
- English
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