Improvement of thick a-Si radiation detectors by field profile tailoring
Conference
·
OSTI ID:10178076
Application of thick ({approximately}50 {mu}m) a-Si p-i-n diodes as a direct radiation detector for minimum ionizing particles is hampered by the need to apply large bias voltages in order fully to deplete the detecting intrinsic layer, which typically contains 5 {minus} 10 {times} 10{sup 14} ionizable dangling bonds per CM{sup 3}. By insertion of thin p-type layers at intervals within the intrinsic layer, the required depletion voltage can be reduced by a factor of at least 1/(n+l) where n is the number of layers inserted. This principle is demonstrated for devices approximately 12{mu}m in thickness. It is shown that electron losses within the p type layer can be kept to minimum by choice of a low doping concentration for the introduced players.
- Research Organization:
- Lawrence Berkeley Lab., CA (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 10178076
- Report Number(s):
- LBL--32445; CONF-920402--57; ON: DE92041192
- Country of Publication:
- United States
- Language:
- English
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