Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Enhancement of creep resistance of a sintered Si{sub 3}N{sub 4} ceramic by microwave annealing

Conference ·
OSTI ID:10177448
Creep behavior was investigated for a sintered Si{sub 3}N{sub 4} Ceramic microwave annealing at 1400 and 1500 C for 20 h. Results of creep tests at 1200 C showed that microwave annealing can enhance the creep resistance in terms of lowering creep rate and, hence, extending creep rupture life, but the 1400 C annealing was most effective. X-ray diffraction analyses showed that the crystalline second phase was transformed as a result of microwave annealing from single phase Y{sub 10}Al{sub 2}Si{sub 3}O{sub 18}N{sub 4} to several different phases. The situation was further complicated by evolution of additional phases during high temperature creep experiments.
Research Organization:
Oak Ridge National Lab., TN (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
AC05-84OR21400
OSTI ID:
10177448
Report Number(s):
CONF-9310328--2; ON: DE94017688
Country of Publication:
United States
Language:
English