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Fabrication of biaxially oriented YBCO on (00{ell}) biaxially oriented yttria-stabilized-zirconia on polycrystalline substrates

Conference ·
OSTI ID:10164164
Ion-assisted, ion-beam sputter deposition is used to obtain (00l) biaxially oriented films of cubic yttria-stabilized-zirconia (YSZ) on polycrystalline metal substrates. Yttrium-barium-copper-oxide (YBCO) is then heteroepitaxially-pulse-laser deposited onto the YSZ. Phi scans of the films show the full-width-half maxima of the YSZ (202) and the YBCO(103) reflections to be 14{degree} and 10{degree} respectively. Our best dc transport critical current density measurement for the YBCO is 800,000 A/cm{sup 2} at 75K and 0T. At 75K, the total dc transport current in a 1 cm wide YBCO film is 23 A.
Research Organization:
Los Alamos National Lab., NM (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
W-7405-ENG-36
OSTI ID:
10164164
Report Number(s):
LA-UR--94-1614; CONF-9404189--1; ON: DE94014808
Country of Publication:
United States
Language:
English