TlBa{sub 2}CaCu{sub 2}O{sub x} epitaxial films: Irreversibility, 2-D pinning, and critical currents
- Argonne National Lab., IL (United States)
- General Electric Corporate Research and Development, Schenectady, NY (United States)
- Superconductor Technologies, Inc., Santa Barbara, CA (United States)
Post-annealed epitaxial thin films of TlBa{sub 2}CaCu{sub 2}O{sub x} (Tl-1212) have been fabricated using sputtered precursors. Values of the transport critical current (J{sub c}) for Tl-1212 epitaxial thin films in magnetic fields up to 7 tesla and at temperatures ranging from 25 to 77K are reported. These values are compared with those for Tl-2212 epitaxial films, Tl-2212 polycrystalline films, and Tl-1223 polycrystalline duck films. This comparison explicitly demonstrates the roles of grain boundaries and anisotropy in limiting the transport J{sub c}. Analysis also supports the existence of a universal pinning defect in every highly anisotropic high-temperature superconductor, with a lower bound on the size of the defect being approximately 12{Angstrom} in diameter.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States); National Science Foundation, Washington, DC (United States)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 10159356
- Report Number(s):
- ANL/MSD/PP-78801; ON: DE94013433; CNN: Contract DMR-91-20000(DHK)
- Resource Relation:
- Other Information: PBD: Jan 1993
- Country of Publication:
- United States
- Language:
- English
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