Direct retrieval of crystal structures by maximum entropy analysis of incoherent Z-contrast images

Conference · Tue Mar 01 00:00:00 EST 1994

OSTI ID:10158917

McGibbon, A J; Pennycook, S J

In Z-contrast imaging in a STEM, the incoherent image can be interpreted as a convolution between the incident electron probe and the projected crystal structure. Deconvolution routines can be used to retrieve the lattice, particularly with the image processing technique of maximum entropy (based on Bayesian probability). A graded SiGe structure, Si, and GaAs are used as examples.

• Research Organization: Oak Ridge National Lab., TN (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: AC05-84OR21400
• OSTI ID: 10158917
• Report Number(s): CONF-940753-18; ON: DE94013262
• Resource Relation: Conference: Microscopy Society of America and Microbeam Analysis Society joint meeting,New Orleans, LA (United States),31 Jul - 5 Aug 1994; Other Information: PBD: Mar 1994
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
36 MATERIALS SCIENCE
CRYSTAL STRUCTURE
SCANNING ELECTRON MICROSCOPY
IMAGE PROCESSING
SILICON ALLOYS
GERMANIUM ALLOYS
SILICON
GALLIUM ARSENIDES
400101
360602
ACTIVATION, NUCLEAR REACTION, RADIOMETRIC, AND RADIOCHEMICAL PROCEDURES
STRUCTURE AND PHASE STUDIES