A gradient method for anomalous small-angle x-ray scattering

Technical Report · Tue Sep 15 04:00:00 EDT 1992

DOI:https://doi.org/10.2172/10149708· OSTI ID:10149708

Jemian, P R ^[1]; Weertman, J R ^[2]; Long, G G ^[3]

---

1. Argonne National Lab., IL (United States)
2. Northwestern Univ., Evanston, IL (United States). Dept. of Materials Science and Engineering
3. National Institute of Standards and Technology, Gaithersburg, MD (United States). Ceramics Div.

A new method of general applicability for analyzing data from anomalous dispersion small-angle X-ray scattering (ASAXS) measurements is described. ASAXS is used as a contrast variation method to label the scattering from a single element in a complex material containing several types of scatterers. The contrast variation is achieved through the anomalous dispersion of X-rays. Thus only one sample is required for a complete analysis. To label a scatterer by ASAXS, the atomic scattering factor of an element in the sample is varied by the selection of photon energies near the absorption edge of the element. Careful selection of the photon energies allows the contrast of only the labeled scatterer to change. Data from several small-angle scattering measurements, each conducted at a fixed energy, are combined in a single analysis. The gradient method, used as an extension to a standard SAXS data analysis method, is demonstrated by isolating the volume fraction size distribution of Cr{sub 23}C{sub 6} in 9Cr-1 MoVNb steel.

• Research Organization: Argonne National Lab., IL (United States); Northwestern Univ., Evanston, IL (United States). Dept. of Materials Science and Engineering
• Sponsoring Organization: USDOE, Washington, DC (United States); Department of Commerce, Washington, DC (United States)
• DOE Contract Number: W-31109-ENG-38; FG02-86ER45229
• OSTI ID: 10149708
• Report Number(s): ANL/MSD/PP--77650; ON: DE94011519
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360102
360202
42 ENGINEERING
420500
ANGULAR DISTRIBUTION
MATERIALS TESTING
MATHEMATICAL MODELS
SMALL ANGLE SCATTERING
STRUCTURE AND PHASE STUDIES
X-RAY DIFFRACTION