Electrooptical and optical evaluation of Pb(Zr,Ti)O{sub 3} thin films using waveguide refractometry

Conference · Fri Dec 31 04:00:00 EST 1993

OSTI ID:10120730

Potter, Jr, B G; Sinclair, M B; Dimos, D; Tuttle, B A; Schwartz, R W

Prism-coupled, waveguide refractometry was utilized to independently monitor electric field-induced changes in the extraordinary and ordinary refractive indices of a Pb(Zr{sub 0.53}Ti{sub 0.47})O{sub 3}(PZT 53/47) thin film. Under an electric field, applied normal to the film plane and corresponding to saturation of the electric polarization, ratio of the extraordinary to ordinary refractive index change ({Delta}n{sub e}/{Delta}n{sub o}) is found to be {minus}4/1, contributing to a net birefringence change ({Delta}n{sub e}-n{sub o}) of {minus}0.021. The technique, thus, accesses both diagonal and off-diagonal elements of the electrooptic response tensor describing the macroscopic behavior of the polycrystalline film. In addition, the widths of waveguide mode reflectivity minima were sensitive to variation in the microstructure of several PZT (40/60) films, indicating that the refractometry technique can provide information helpful in evaluating optical quality in these films.

• Research Organization: Sandia National Labs., Albuquerque, NM (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 10120730
• Report Number(s): SAND--93-0974C; CONF-931142--7; ON: DE94006374; BR: GB0103012
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360204
BIREFRINGENCE
ELECTRIC FIELDS
ELECTRO-OPTICAL EFFECTS
HYSTERESIS
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
PZT
REFLECTIVITY
REFRACTIVE INDEX
THIN FILMS