Colloid formation in copper-implanted fused silica and silicate glasses
- Padua Univ., (Italy). Ist. di Fisica; and others
Copper implantations (90 keV, 5{times}10{sup 16} ions/cm{sup 2}) were made into fused silica, borosilicate glasses and soda-lime glass. The copper distribution has been found to vary according to glass type. The optical absorption band characteristic of the implanted metal optical properties was observed only for copper-implanted fused silica. Absorption for all the other samples was either not observable or was negligibly small, however very small metallic particles are present also in soda-lime glass. Subsequent nitrogen implantation (100 keV, 1.5{times}10{sup 17} ions/cm{sup 2}) completely eliminated the copper-colloid induced absorption in the copper-implanted fused silica, while it facilitated formation of copper-colloids in soda-lime glass.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 10111388
- Report Number(s):
- SAND-93-3825C; CONF-9309259-4; ON: DE94004672; BR: GB0103012
- Resource Relation:
- Conference: Nuclear instruments and methods in physics research on radiation effects in insulators,Nagoya (Japan),5-10 Sep 1993; Other Information: PBD: [1993]
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
GLASS
ION IMPLANTATION
SILICON OXIDES
BOROSILICATE GLASS
PHYSICAL RADIATION EFFECTS
COPPER IONS
NITROGEN IONS
KEV RANGE 10-100
COLLOIDS
360605
665300
RADIATION EFFECTS
INTERACTIONS BETWEEN BEAMS AND CONDENSED MATTER