Geochemical mapping of the lunar surface using laser-induced ion mass spectrometry from landers and rovers

Conference · Tue Dec 01 04:00:00 EST 1992

OSTI ID:10110204

Funsten, H O; Elphic, R C; Blacic, J D; Borovsky, J E; McComas, D J; Nordholt, J E

In-situ lunar geochemical assessment is essential when remotely prospecting for lunar resources or characterizing the mineralogy of a lunar site. We discuss a technique for lunar geochemical mapping from landed platforms using Laser-induced Ion Mass Spectrometry (LIMS). In this technique, a focused diode-pumped Nd:YAG laser on an lunar lander or rover vaporizes a thin layer of a soil or rock target located at a range of 1 to 100 m. The vapor is ionized through electron heating by inverse Bremsstrahlung, and the expanding plasma cloud contains information about the target composition. Ions in this plasma are analyzed using specialized time-of-flight ion mass spectrometry, providing detailed composition analysis of the lunar surface. In considering this technique, we discuss the effects on the ion trajectories of ambient electric and magnetic fields and present a high sensitivity, high mass-resolution mass spectrometer that is capable of detecting low atomic mass abundances, trace elements, and isotopic variations.

• Research Organization: Los Alamos National Lab., NM (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: W-7405-ENG-36
• OSTI ID: 10110204
• Report Number(s): LA-UR--92-3821; CONF-9211130--1; ON: DE93003849
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400102
440800
47 OTHER INSTRUMENTATION
661300
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CHARGE TRANSPORT
CHEMICAL AND SPECTRAL PROCEDURES
ELECTRIC FIELDS
FEASIBILITY STUDIES
GEOCHEMICAL SURVEYS
LASER-PRODUCED PLASMA
MAGNETIC FIELDS
MASS SPECTROSCOPY
MISCELLANEOUS INSTRUMENTATION
MOON
NEODYMIUM LASERS
OTHER ASPECTS OF PHYSICAL SCIENCE
SURFACES
TIME-OF-FLIGHT SPECTROMETERS
TOPOLOGICAL MAPPING