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U.S. Department of Energy
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Fast ion chambers for SLC

Conference ·
OSTI ID:10105385
Beam diagnostic ion chambers are used throughout the SLC to perform a variety of tasks including locating beam losses along the beam direction, determining localized losses from individual bunches in a multibunch beam, and detecting scattered particles from beam profile wire scanners where backgrounds are too high to use photomultiplier tubes. Construction and instrumentation of very fast ion chambers with pulse duration of less than 60ns are detailed. Long ion chambers referred to as PLIC (Panofsky`s Long Ion Chamber) are the primary diagnostic used to locate losses in all the SLC transport lines. Accurately locating beam loss with the use of fiducial cables and coaxial switches will be discussed.
Research Organization:
Stanford Linear Accelerator Center, Menlo Park, CA (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
AC03-76SF00515
OSTI ID:
10105385
Report Number(s):
SLAC-PUB--6296; CONF-930511--499; ON: DE94003439
Country of Publication:
United States
Language:
English

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