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Title: Oriented lead zirconate titanate thin films: Characterization of film crystallization

Abstract

Film processing temperature and time was varied to characterize the pyrochlore-to-perovskite crystallization of solution-derived PZT 20/80 thin films. 3000 {Angstrom} thick films were prepared by spin deposition using <100> single crystal MgO as substrate. By controlled rapid thermal processing, films at different stages in the perovskite crystallization process were prepared with the tetragonal PZT 20/80 phase being <100>/<001> oriented relative to the MgO surface. An activation energy for the conversion process of 326 kJ/mole was determined by use of an Arrhenius expression using rate constants found by application of the method of Avrami. Activation energy for formation of the PZT 20/80 perovskite phase of the solution-derived films compared favorably with that calculated from data by Kwok and Desu for sputter-deposited 3500 {Angstrom} thick PZT 55/45 films. Similarity in activation energies indicates that the energetics of the conversion process are not strongly dependent on the method used for film deposition.

Authors:
; ; ; ; ;
Publication Date:
Research Org.:
Sandia National Labs., Albuquerque, NM (United States)
Sponsoring Org.:
USDOE, Washington, DC (United States)
OSTI Identifier:
10104972
Report Number(s):
SAND-92-2905C; CONF-930405-50
ON: DE94003104; BR: GB0103012
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Spring meeting of the Materials Research Society,San Francisco, CA (United States),12-16 Apr 1993; Other Information: PBD: [1993]
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; PZT; CRYSTALLIZATION; CRYSTAL-PHASE TRANSFORMATIONS; THIN FILMS; ACTIVATION ENERGY; 360602; STRUCTURE AND PHASE STUDIES

Citation Formats

Voigt, J.A., Tuttle, B.A., Headley, T.J., Eatough, M.O., Lamppa, D.L., and Goodnow, D. Oriented lead zirconate titanate thin films: Characterization of film crystallization. United States: N. p., 1993. Web.
Voigt, J.A., Tuttle, B.A., Headley, T.J., Eatough, M.O., Lamppa, D.L., & Goodnow, D. Oriented lead zirconate titanate thin films: Characterization of film crystallization. United States.
Voigt, J.A., Tuttle, B.A., Headley, T.J., Eatough, M.O., Lamppa, D.L., and Goodnow, D. Mon . "Oriented lead zirconate titanate thin films: Characterization of film crystallization". United States. https://www.osti.gov/servlets/purl/10104972.
@article{osti_10104972,
title = {Oriented lead zirconate titanate thin films: Characterization of film crystallization},
author = {Voigt, J.A. and Tuttle, B.A. and Headley, T.J. and Eatough, M.O. and Lamppa, D.L. and Goodnow, D.},
abstractNote = {Film processing temperature and time was varied to characterize the pyrochlore-to-perovskite crystallization of solution-derived PZT 20/80 thin films. 3000 {Angstrom} thick films were prepared by spin deposition using <100> single crystal MgO as substrate. By controlled rapid thermal processing, films at different stages in the perovskite crystallization process were prepared with the tetragonal PZT 20/80 phase being <100>/<001> oriented relative to the MgO surface. An activation energy for the conversion process of 326 kJ/mole was determined by use of an Arrhenius expression using rate constants found by application of the method of Avrami. Activation energy for formation of the PZT 20/80 perovskite phase of the solution-derived films compared favorably with that calculated from data by Kwok and Desu for sputter-deposited 3500 {Angstrom} thick PZT 55/45 films. Similarity in activation energies indicates that the energetics of the conversion process are not strongly dependent on the method used for film deposition.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1993},
month = {11}
}

Conference:
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