RIXS, XEOL and XEOL Imaging of Rare-earth Phosphors at the L3,2-edges

Conference · Mon Jul 19 04:00:00 EDT 2010

DOI:https://doi.org/10.1063/1.3463158· OSTI ID:1009072

Sham, T K; Gordon, R A ^[1]

---

1. Simon, UWash

Capabilities at the PNC-XOR of the Advanced Photon Source to monitor Resonant Inelastic X-ray Scattering (RIXS) in the intermediate X-ray energy range using a wavelength dispersive spectrometer (WDX) and associated X-ray Excited Optical Luminescence (XEOL) using an optical spectrometer will be described. Ce L3 -edge of Ce and Tb doped inorganic phosphors have been investigated using these techniques and corresponding X-ray Absorption Near-Edge Structures (XANES) using a micro X-ray beam with X-ray fluorescence and optical luminescence yield. Results from these studies and their prospects for future applications in XEOL imaging will be discussed.

• Research Organization: Advanced Photon Source (APS), Argonne National Laboratory (ANL), Argonne, IL (US)
• Sponsoring Organization: USDOE
• OSTI ID: 1009072
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

43 PARTICLE ACCELERATORS
ABSORPTION
ADVANCED PHOTON SOURCE
ENERGY RANGE
FLUORESCENCE
INORGANIC PHOSPHORS
LUMINESCENCE
MONITORS
OPTICAL SPECTROMETERS
PHOSPHORS
RADIATIONS
SCATTERING
SPECTROMETERS
WAVELENGTHS