X-ray excited optical luminescence (XEOL) detection of x-ray absorption fine structure (XAFS)

Journal Article · Thu Oct 01 04:00:00 EDT 1998 · Journal of Chemical Physics

DOI:https://doi.org/10.1063/1.477320· OSTI ID:662184

Soderholm, L; Liu, G K; Antonio, M R ^[1]; Lytle, F W ^[2]

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1. Chemistry Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
2. The EXAFS Co., Pioche, Nevada 89043 (United States)

The x-ray excited optical luminescence (XEOL) from a variety of rare-earth ions was used as a detection mode for the collection of {ital L}-edge x-ray absorption fine-structure (XAFS) data. In order to understand the source of the observed optical signal, advantage is taken of the known luminescent response of {ital f} ions in a variety of transparent host materials. Whereas some samples exhibit an optical response that is indistinguishable from the transmission XAFS data, other samples show marked differences between the data obtained with the two different detection schemes. The unexpected optical luminescence of a Gd{sub 2}O{sub 3} sample is traced to a Eu impurity. An optical spectrum of 0.4{percent} Tb in Gd{sub 2}O{sub 2}S, excited by x-ray photons at the Gd edge, is used to demonstrate that the optical signal may arise from an ion different from the absorbing ion. The implications of this energy transfer are discussed in terms of the suitability of XEOL as a detection scheme for XAFS spectroscopy. {copyright} {ital 1998 American Institute of Physics.}

• OSTI ID: 662184
• Journal Information: Journal of Chemical Physics, Journal Name: Journal of Chemical Physics Journal Issue: 16 Vol. 109; ISSN JCPSA6; ISSN 0021-9606
• Country of Publication: United States
• Language: English

Related Subjects

66 PHYSICS
ENERGY TRANSFER
FINE STRUCTURE
GADOLINIUM OXIDES
IMPURITIES
INNER-SHELL EXCITATION
PHOTOLUMINESCENCE
X-RAY SPECTROSCOPY