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Title: Optical XAFS of ZnO Nanowires at the Zn K-Edge and Related Phenomena

Abstract

We report x-ray excited optical luminescence (XEOL) from one-dimensional nanostructures of ZnO excited with photon energies across the Zn K-edge. The optical luminescence shows an UV and a green emission band characteristic of near band edge and defect emission, respectively. The optical channels were used in turn to monitor the Zn K-edge XAFS to high k values. The densities of states of oxygen character in the valence band were also studied with x-ray emission spectroscopy (XES). The Zn K-edge decay dynamics was examined with time-resolved x-ray excited optical luminescence.

Authors:
; ; ; ; ; ; ; ; ; ;  [1];  [2];  [2];  [2]
  1. (APS)
  2. (
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Org.:
USDOE
OSTI Identifier:
1009007
Resource Type:
Conference
Resource Relation:
Conference: 13th International Conference on X-ray Absorption Fine Structure-XAFS13;9-14 July 2006;Stanford, California, USA
Country of Publication:
United States
Language:
ENGLISH
Subject:
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; 77 NANOSCIENCE AND NANOTECHNOLOGY; ABSORPTION; DECAY; DEFECTS; EMISSION SPECTROSCOPY; LUMINESCENCE; MONITORS; NANOSTRUCTURES; OXYGEN; PHOTONS; VALENCE

Citation Formats

Heigl, F., Sun, X.H.J, Lam, S., Sham, T.K., Gordon, R., Brewe, D., Rosenberg, R., Shenoy, G., Yablonskikh, M., MacNaughton, J., Moewes, A., UWO), Simon), and Saskatchewan). Optical XAFS of ZnO Nanowires at the Zn K-Edge and Related Phenomena. United States: N. p., 2008. Web.
Heigl, F., Sun, X.H.J, Lam, S., Sham, T.K., Gordon, R., Brewe, D., Rosenberg, R., Shenoy, G., Yablonskikh, M., MacNaughton, J., Moewes, A., UWO), Simon), & Saskatchewan). Optical XAFS of ZnO Nanowires at the Zn K-Edge and Related Phenomena. United States.
Heigl, F., Sun, X.H.J, Lam, S., Sham, T.K., Gordon, R., Brewe, D., Rosenberg, R., Shenoy, G., Yablonskikh, M., MacNaughton, J., Moewes, A., UWO), Simon), and Saskatchewan). Mon . "Optical XAFS of ZnO Nanowires at the Zn K-Edge and Related Phenomena". United States. doi:.
@article{osti_1009007,
title = {Optical XAFS of ZnO Nanowires at the Zn K-Edge and Related Phenomena},
author = {Heigl, F. and Sun, X.H.J and Lam, S. and Sham, T.K. and Gordon, R. and Brewe, D. and Rosenberg, R. and Shenoy, G. and Yablonskikh, M. and MacNaughton, J. and Moewes, A. and UWO) and Simon) and Saskatchewan)},
abstractNote = {We report x-ray excited optical luminescence (XEOL) from one-dimensional nanostructures of ZnO excited with photon energies across the Zn K-edge. The optical luminescence shows an UV and a green emission band characteristic of near band edge and defect emission, respectively. The optical channels were used in turn to monitor the Zn K-edge XAFS to high k values. The densities of states of oxygen character in the valence band were also studied with x-ray emission spectroscopy (XES). The Zn K-edge decay dynamics was examined with time-resolved x-ray excited optical luminescence.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Oct 06 00:00:00 EDT 2008},
month = {Mon Oct 06 00:00:00 EDT 2008}
}

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  • ZnO nanostructures have been synthesized by thermal evaporation on Si substrates. It is found that the morphologies of the nanostructures are governed by growth conditions such as temperature, carrier-gas flow rate, and the nature of the substrate (with and without a catalyst). We report X-ray excited optical luminescence from ZnO nanostructures of distinctly different morphologies in the energy and time domain using excitation photon energies across the Zn K-edge. X-ray excited optical luminescence (XEOL) and X-ray absorption near edge structure (XANES) study has clearly shown the morphology dependence of the ZnO optical properties. A correlation of luminescence with morphology, size,more » and crystallinity emerges.« less
  • Electron-yield XAFS measurements using the NSLS were made on e-beam evaporated Co/Pd multilayers with various sublayer thicknesses and different thickness ratios of Co to Pd sublayers. The Co K-edge and the Pd K-edge XAFS data were obtained for the Co/Pd multilayers with sublayer thicknesses of 3[Angstrom]/ 4[Angstrom], 15[Angstrom]/4[Angstrom], 3[Angstrom]/15[Angstrom], 2.1[Angstrom]/13.5[Angstrom], and 2.2[Angstrom]/4.5[Angstrom]. Fourier transforms of Co K XAFS for most samples show a splitting of major peak, and the magnitude ratio of these split peaks varies systematically with the thickness ratio of the Pd sublayer to the Co sublayer, whereas the Fourier transforms of the Pd K XAFS for themore » same samples do not show a splitting of peaks. As a preliminary analysis, the Co K XAFS and the split peaks in the Fourier transform for the Co/Pd(3[Angstrom]/4[Angstrom]) case were simulated by using the FEFF calculations, and the Co K XAFS and the major peak in the fourier transform for the Co/Pd(15[Angstrom]/4[Angstrom]) case were also simulated consistently.« less
  • Electron-yield XAFS measurements using the NSLS were made on e-beam evaporated Co/Pd multilayers with various sublayer thicknesses and different thickness ratios of Co to Pd sublayers. The Co K-edge and the Pd K-edge XAFS data were obtained for the Co/Pd multilayers with sublayer thicknesses of 3{Angstrom}/ 4{Angstrom}, 15{Angstrom}/4{Angstrom}, 3{Angstrom}/15{Angstrom}, 2.1{Angstrom}/13.5{Angstrom}, and 2.2{Angstrom}/4.5{Angstrom}. Fourier transforms of Co K XAFS for most samples show a splitting of major peak, and the magnitude ratio of these split peaks varies systematically with the thickness ratio of the Pd sublayer to the Co sublayer, whereas the Fourier transforms of the Pd K XAFS for themore » same samples do not show a splitting of peaks. As a preliminary analysis, the Co K XAFS and the split peaks in the Fourier transform for the Co/Pd(3{Angstrom}/4{Angstrom}) case were simulated by using the FEFF calculations, and the Co K XAFS and the major peak in the fourier transform for the Co/Pd(15{Angstrom}/4{Angstrom}) case were also simulated consistently.« less
  • The local environment about oxygen atoms in Pr[sub [ital x]]Y[sub 1[minus][ital x]]Ba[sub 2]Cu[sub 3]O[sub 7] films obtained by laser ablation has been investigated by means of the x-ray absorption fine structure (XAFS) spectroscopy at the O K-edge. It has been found that the Pr atoms do not subsitute for the Cu atoms nor form interstitial defects in the CuO[sub 2] planes and that the presence of Pr dopant does not disturb the local environment of oxygen.
  • The local environment about oxygen atoms in Pr{sub x}Y{sub 1-x}Ba{sub 2}Cu{sub 3}O{sub 7} films obtained by laser ablation has been investigated by means of the x-ray absorption fine structure (XAFS) spectroscopy at the O K-edge. It has been found that the Pr atoms do not substitute for the Cu atoms nor form interstitial defects in the CuO{sub 2} planes and that the presence of Pr dopant does not disturb the local environment of oxygen.