XAFS studies of Pt nanoparticles deposition on Si nanowires

Journal Article · Tue Dec 01 04:00:00 UTC 2009 · J. Phys. Conf. Series

DOI:https://doi.org/10.1088/1742-6596/190/1/012133· OSTI ID:1005959

Liu, Lijia; Murphy, M; Ko, J Y.P.; Sham, T K

We have studied X-ray absorption fine structures (XAFS) of Pt nanoparticles (PtNPs) which were deposited on silicon nanowires (SiNWs). SiNWs were fabricated via an electroless chemical etching method and served as the template for the immobilization of PtNPs. PtNPs electrolessly reduced from their ionic solution by HF-treated SiNWs were found to deposit on the tips of the SiNWs. The electronic structures of Pt were studied using X-ray absorption near-edge structures (XANES) at Pt L{sub 3,2}-edge. For comparison, we also examined the Pt L{sub 3,2}-edge and the Au L{sub 3}-edge XANES of Pt-Au bimetallic nanoparticles co-deposited on SiNWs. We found that the PtNPs showed slightly increased whiteline intensity compared to that of Pt foil. When Au was deposited together with Pt, the resonance peaks of the NPs were slightly, but systematically shifted due to the formation of Pt-Au alloy.

• Research Organization: Argonne National Laboratory (ANL)
• Sponsoring Organization: USDOE
• OSTI ID: 1005959
• Journal Information: J. Phys. Conf. Series, Journal Name: J. Phys. Conf. Series Journal Issue: 2009 Vol. 190
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ABSORPTION
DEPOSITION
ELECTRONIC STRUCTURE
ETCHING
FINE STRUCTURE
RESONANCE
SILICON