Vector Piezoresponse Force Microscopy

Journal Article · Sat Dec 31 23:00:00 EST 2005 · Microscopy and Microanalysis

DOI:https://doi.org/10.1017/S1431927606060156· OSTI ID:1003570

Kalinin, Sergei V ^[1]; Rodriguez, Brian J ^[1]; Jesse, Stephen ^[1]; Shin, Junsoo ^[1]; Baddorf, Arthur P ^[1]; Gupta, P. ^[2]; Jain, H. ^[2]; Williams, D. B. ^[2]; Gruverman, A. ^[3]

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1. ORNL
2. Lehigh University, Bethlehem, PA
3. North Carolina State University

A novel approach for nanoscale imaging and characterization of the orientation dependence of electromechanical properties - vector piezoresponse force microscopy (Vector PFM) - is described. The relationship between local electromechanical response, polarization, piezoelectric constants, and crystallographic orientation is analyzed in detail. The image formation mechanism in vector PFM is discussed. Conditions for complete three-dimensional (3D) reconstruction of the electromechanical response vector and evaluation of the piezoelectric constants from PFM data are set forth. The developed approach can be applied to crystallographic orientation imaging in piezoelectric materials with a spatial resolution below 10 nm. Several approaches for data representation in 2D-PFM and 3D-PFM are presented. The potential of vector PFM for molecular orientation imaging in macroscopically disordered piezoelectric polymers and biological systems is discussed.

• Research Organization: Oak Ridge National Laboratory (ORNL)
• Sponsoring Organization: ORNL LDRD Seed-Money
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 1003570
• Journal Information: Microscopy and Microanalysis, Journal Name: Microscopy and Microanalysis Journal Issue: 3 Vol. 12; ISSN 1431-9276; ISSN MIMIF7
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
BIOLOGICAL MATERIALS
CRYSTALS
EVALUATION
MICROSCOPY
ORIENTATION
PIEZOELECTRICITY
POLARIZATION
POLYMERS
SPATIAL RESOLUTION