Piezoresponse Force Microscopy and Recent Advances in Nanoscale Studies of Ferroelectrics

Journal Article · Sat Dec 31 23:00:00 EST 2005 · Journal of Materials Science

DOI:https://doi.org/10.1007/s10853-005-5946-0· OSTI ID:1003503

Gruverman, A. ^[1]; Kalinin, Sergei V ^[2]

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1. North Carolina State University
2. ORNL

In this paper, we review recent advances in piezoresponse force microscopy (PFM) with respect to nanoscale ferroelectric research, summarize the basic principles of PFM, illustrate what information can be obtained from PFM experiments and delineate the limitations of PFM signal interpretation relevant to quantitative imaging of a broad range of piezoelectrically active materials. Particular attention is given to orientational PFM imaging and data interpretation as well as to electromechanics and kinetics of nanoscale ferroelectric switching in PFM.

• Research Organization: Oak Ridge National Laboratory (ORNL)
• Sponsoring Organization: ORNL LDRD Seed-Money
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 1003503
• Journal Information: Journal of Materials Science, Journal Name: Journal of Materials Science Journal Issue: 1 Vol. 41; ISSN 1573-4803; ISSN 0022-2461
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
77 NANOSCIENCE AND NANOTECHNOLOGY
FERROELECTRIC MATERIALS
MICROSCOPY
NANOSTRUCTURES
PERFORMANCE
PIEZOELECTRICITY