Materials Contrast in Piezoresponse Force Microscopy

Journal Article · Sun Jan 01 00:00:00 EST 2006 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.2206992· OSTI ID:1003517

Kalinin, Sergei V ^[1]; Eliseev, E. A. ^[2]; Morozovska, A. N. ^[2]

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1. ORNL
2. National Academy of Science of Ukraine, Kiev, Ukraine

Piezoresponse force microscopy (PFM) contrast in transversally isotropic material corresponding to the case of c{sup +}-c{sup -} domains in tetragonal ferroelectrics is analyzed using Green's function theory by Felten et al. [J. Appl. Phys. 96, 563 (2004)]. A simplified expression for PFM signal as a linear combination of relevant piezoelectric constant is obtained. This analysis is extended to piezoelectric material of arbitrary symmetry with weak elastic and dielectric anisotropies. These results provide a framework for interpretation of PFM signals for systems with unknown or poorly known local elastic and dielectric properties, including nanocrystalline materials, ferroelectric polymers, and biopolymers.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: DE-AC05-00OR22725
• OSTI ID: 1003517
• Journal Information: Applied Physics Letters, Vol. 88, Issue 23; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
DIELECTRIC MATERIALS
DIELECTRIC PROPERTIES
MICROSCOPY
POLYMERS
SYMMETRY