Extrinsic Size Effect in Piezoresponse Force Microscopy of Thin Films

Journal Article · Sun Dec 31 23:00:00 EST 2006 · Physical Review B

DOI:https://doi.org/10.1103/PhysRevB.76.054123· OSTI ID:965291

Morozovska, A. N. ^[1]; Svechnikov, S. V. ^[1]; Eliseev, E. A. ^[1]; Kalinin, Sergei V ^[2]

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1. National Academy of Science of Ukraine, Kiev, Ukraine
2. ORNL

The extrinsic size effect in piezoresponse force microscopy of ferroelectric and piezoelectric thin films on nonpolar dielectric substrate with matching elastic properties is analyzed. Analytical expressions for effective piezoresponse, object transfer function components, and Rayleigh two-point resolution are obtained. These results can be broadly applied for effective piezoelectric response calculations in thin piezoelectric and ferroelectric films as well as surface polar layers in, e.g., organic materials and biopolymers. In particular, the effective piezoresponse strongly decreases with film thickness, whereas the sharpness of domain stripe image increases due to the object transfer function spectrum broadening.

• Research Organization: Oak Ridge National Laboratory (ORNL)
• Sponsoring Organization: SC USDOE - Office of Science (SC)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 965291
• Journal Information: Physical Review B, Journal Name: Physical Review B Journal Issue: 5 Vol. 76; ISSN 1098-0121
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
DIELECTRIC MATERIALS
ELASTICITY
MICROSCOPY
RESOLUTION
SUBSTRATES
THICKNESS
THIN FILMS
TRANSFER FUNCTIONS