Nondestructive Three-Dimensional Characterization of Grain Boundaries by X-Ray Crystal Microscopy
- ORNL
The results from an emerging method of nondestructive grain boundary characterization, with unprecedented sensitivity to neighbor-grain misorientation and grain boundary morphology are reported. The method utilizes differential aperture X-ray microscopy to determine the local crystallographic orientation of submicron volumes within polycrystalline materials. Initial measurements are described for a recrystallized Ni sample where the grain boundary type was identified at 85 grain boundaries within the framework of an ideal coincident site lattice (CSL) model. The remarkable resolution of this method is demonstrated by the <0.03{sup o} deviations of misorientation measured for {Sigma}3 (twin) boundaries. Because of its high angular and spatial resolution, this new approach to grain boundary characterization can provide quantitative tests of grain boundary models with new insights for grain boundary engineering efforts.
- Research Organization:
- Oak Ridge National Laboratory (ORNL)
- Sponsoring Organization:
- SC USDOE - Office of Science (SC)
- DOE Contract Number:
- AC05-00OR22725
- OSTI ID:
- 1003373
- Journal Information:
- Ultramicroscopy, Journal Name: Ultramicroscopy Journal Issue: 3 Vol. 103; ISSN 0304-3991
- Country of Publication:
- United States
- Language:
- English
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