Characterization of Three-Dimensional Crystallographic Distributions Using Polychromatic X-ray Microdiffractions

Journal Article · Sat Dec 31 23:00:00 EST 2005 · Scripta Materialia

DOI:https://doi.org/10.1016/j.scriptamat.2006.02.046· OSTI ID:1003284

Ice, Gene E ^[1]; Pang, Judy ^[1]; Barabash, Rozaliya ^[1]; Puzyrev, Yevgeniy S ^[1]

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1. ORNL

Polychromatic microdiffraction uses small X-ray beams to characterize the local crystallographic structure of materials. When combined with a depth resolving technique called differential aperture microscopy, the phase and local orientation of femto-liter volumes (0.5 x 0.5 x 0.7 {micro}m{sup 3}) can be resolved beneath the surface of a sample. In addition, the local elastic strain and dislocation tensors can also be determined and the local dislocation type can be modeled. Here we present recent technical developments, including example applications and emerging research directions.

• Research Organization: Oak Ridge National Laboratory (ORNL)
• Sponsoring Organization: SC USDOE - Office of Science (SC)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 1003284
• Journal Information: Scripta Materialia, Journal Name: Scripta Materialia Journal Issue: 1 Vol. 55; ISSN 1359-6462
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
APERTURES
DISLOCATIONS
MICROSCOPY
ORIENTATION
STRAINS