Charge injection into small semiconductor particles

Conference · Thu Jun 01 00:00:00 EDT 1995

OSTI ID:93627

Lawless, D; Luangdilok, C; Cook, A R; Meisel, D

We report on the effect of the injection of electrons into small CdS particles on their spectroscopy. Solvated electrons were generated pulse radiolytically and their reaction with the particles was monitored. As a result of the excess charge, the absorption by the particle in the exciton region is bleached. The bleaching tacks the shift in band edge as the particle size decreases. However, excess electrons in larger particles are more efficient tan in small particles. It is concluded that the effort originates in the electric field effect generated by the excess charge.

• Research Organization: Argonne National Lab. (ANL), Argonne, IL (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: W-31-109-ENG-38
• OSTI ID: 93627
• Report Number(s): ANL/CHM/CP-85038; CONF-950518-13; ON: DE95013467
• Resource Relation: Conference: 187. meeting of the Electrochemical Society, Reno, NV (United States), 21-26 May 1995; Other Information: PBD: [1995]
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CADMIUM SULFIDES
ELECTRONS
PARTICLES
ELECTRIC FIELDS
BLEACHING
SOLVATED ELECTRONS