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Title: Photovoltaic mechanisms in polycrystalline thin film silicon solar cells. Quarterly technical progress report No. 1, July 30-October 31, 1980

Technical Report ·
DOI:https://doi.org/10.2172/6620390· OSTI ID:6620390

Major accomplishments during the first quarter of the contract period are reported. Small area diode fabrication and analysis has been continued. This technique has further been applied to many RTR ribbons. An optical technique for determination of crystallite orientations has been placed in operation. This technique has many distinct advantages. These are: (1) rapid; (2) can be set-up very inexpensively; (3) well suited for polycrystalline substrates of small grain size; and (4) can easily characterize twins. Accuracies obtained with this technique are about the same as that of the Laue technique. A technique to qualitatively evaluate grain boundary activity in unprocessed substrates has been used and valuable results obtained. Further analysis is being done to use this technique for quantitative evaluation. A major study of G.B. orientation effects is underway. Initial results on RTR ribbons have shown a good correlation of G.B. barrier height with misorientation (tilt boundaries).

Research Organization:
Motorola, Inc., Phoenix, AZ (USA). Solar Energy Dept.
Sponsoring Organization:
USDOE, Office of Solar Energy
DOE Contract Number:
AC02-77CH00178
OSTI ID:
6620390
Report Number(s):
DOE/SERI-9234/1
Country of Publication:
United States
Language:
English