Determination of the specific site occupation of rare earth additions in Y/sub 1/ /sub 7/SM/sub 0/ /sub 6/Lu/sub 0/ /sub 7/Fe/sub 5/O/sub 12/ thin films by the orientation dependence of characteristic x-ray emissions

Conference · Tue Nov 01 00:00:00 EST 1983

OSTI ID:5558845

Krishnan, K M; Rez, P; Mishra, R; Thomas, G

The orientation dependence of characteristic x-ray emissions have been used to determine specific site occupations of Rare Earth additions in epitaxially grown films of Y/sub 1/ /sub 7/Sm/sub 0/ /sub 6/Lu/sub 0/ /sub 7/Fe/sub 5/O/sub 12/. A theoretical formulation based on the assumption of highly localized inner shell excitations was used not only to predict specific site sensitive orientations, but also to refine experimentally observed data employing a constrained least squares analysis to give probabilities for the occupation of the RE additions in the different crystallographic sites. Thus, it has been shown that in this compound the preference for the RE additions is a predominantly octahedral occupation with a probability greater than or equal to 95%. Some of the assumptions and limitations of the technique have also been discussed.

• Research Organization: Lawrence Berkeley Lab., CA (USA)
• DOE Contract Number: AC03-76SF00098
• OSTI ID: 5558845
• Report Number(s): LBL-16884; CONF-831174-54; ON: DE84004632
• Resource Relation: Conference: Materials Research Society annual meeting, Boston, MA, USA, 14 Nov 1983
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
FERRITE GARNETS
CRYSTAL STRUCTURE
LUTETIUM COMPOUNDS
RARE EARTH COMPOUNDS
SAMARIUM COMPOUNDS
YTTRIUM COMPOUNDS
EPITAXY
ORIENTATION
THIN FILMS
X RADIATION
ELECTROMAGNETIC RADIATION
FILMS
IONIZING RADIATIONS
MINERALS
RADIATIONS
SILICATE MINERALS
TRANSITION ELEMENT COMPOUNDS
360602* - Other Materials- Structure & Phase Studies