Determination of the specific site occupation of rare earth additions in Y/sub 1. 7/Sm/sub 0. 6/Fe/sub 5/O/sub 12/ thin films by the orientation dependence of characteristic x-ray emissions

Journal Article · Sun Jan 01 00:00:00 EST 1984 · Mater. Res. Soc. Symp. Proc.; (United States)

OSTI ID:5700883

Krishnan, K M; Rez, P; Mishra, R; Thomas, G

The orientation dependence of characteristic x-ray emissions have been used to determine specific site occupations of rare earth additions in epitaxially grown films of Y/sub 1.7/Sm/sub 0.6/Lu/sub 0.7/Fe/sub 5/O/sub 12/. A theoretical formulation based on the assumption of highly localized inner shell excitations was used not only to predict specific site sensitive orientations, but also to refine experimentally observed data employing a constrained least squares analysis to give probabilities for the occupational of the RE additions in the different crystallographic sites. Thus, it has been shown that in this compound the preference for the RE additions is a predominantly octahedral occupation with a probability > 95%. Some of the assumptions and limitations of the technique have also been discussed. 24 references, 1 figure, 2 tables.

• Research Organization: Lawrence Berkeley Lab., CA
• DOE Contract Number: AC03-76SF00098
• OSTI ID: 5700883
• Journal Information: Mater. Res. Soc. Symp. Proc.; (United States), Vol. 31
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
IRON OXIDES
CRYSTAL STRUCTURE
LUTETIUM OXIDES
SAMARIUM OXIDES
YTTRIUM OXIDES
EXPERIMENTAL DATA
THIN FILMS
CHALCOGENIDES
DATA
FILMS
INFORMATION
IRON COMPOUNDS
LUTETIUM COMPOUNDS
NUMERICAL DATA
OXIDES
OXYGEN COMPOUNDS
RARE EARTH COMPOUNDS
SAMARIUM COMPOUNDS
TRANSITION ELEMENT COMPOUNDS
YTTRIUM COMPOUNDS
360202* - Ceramics
Cermets
& Refractories- Structure & Phase Studies