Speckle contrast of interfering fluorescence X-rays

Trost, Fabian; Ayyer, Kartik; Oberthuer, Dominik; Yefanov, Oleksandr; Bajt, Saša; Caleman, Carl; Weimer, Agnes; Feld, Artur; Weller, Horst; Boutet, Sébastien; Koglin, Jason; Timneanu, Nicusor; von Zanthier, Joachim; Röhlsberger, Ralf; Chapman, Henry N.

doi:10.1107/s1600577522009997

Title: Speckle contrast of interfering fluorescence X-rays

Journal Article · Sun Jan 01 00:00:00 EST 2023 · Journal of Synchrotron Radiation (Online)

DOI:https://doi.org/10.1107/s1600577522009997· OSTI ID:2006432

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^[2];

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^[4]; Weimer, Agnes ^[5]; Feld, Artur ^[5]; Weller, Horst ^[6];

^[7]; Koglin, Jason ^[7];

^[8]; von Zanthier, Joachim ^[9]; Röhlsberger, Ralf ^[1];

^[10]

Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Universität Hamburg (Germany)
Max Planck Institute for the Structure and Dynamics of Matter, Hamburg (Germany); Universität Hamburg (Germany)
Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Uppsala University (Sweden)
Universität Hamburg (Germany)
Universität Hamburg (Germany); Fraunhofer-CAN, Hamburg (Germany)
SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States). Linac Coherent Light Source (LCLS)
Uppsala University (Sweden)
University of Erlangen-Nürnberg (United States)
Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Universität Hamburg (Germany); Uppsala University (Sweden)

With the development of X-ray free-electron lasers (XFELs), producing pulses of femtosecond durations comparable with the coherence times of X-ray fluorescence, it has become possible to observe intensity–intensity correlations due to the interference of emission from independent atoms. This has been used to compare durations of X-ray pulses and to measure the size of a focused X-ray beam, for example. Here it is shown that it is also possible to observe the interference of fluorescence photons through the measurement of the speckle contrast of angle-resolved fluorescence patterns. Speckle contrast is often used as a measure of the degree of coherence of the incident beam or the fluctuations of the illuminated sample as determined from X-ray diffraction patterns formed by elastic scattering, rather than from fluorescence patterns as addressed here. Commonly used approaches to estimate speckle contrast were found to suffer when applied to XFEL-generated fluorescence patterns due to low photon counts and a significant variation of the excitation pulse energy from shot to shot. A new method to reliably estimate speckle contrast under such conditions, using a weighting scheme, is introduced. The method is demonstrated by comparing the speckle contrast of fluorescence observed with pulses of 3 fs to 15 fs duration.

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Research Organization:: SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); Swedish Research Council (SRC)

Grant/Contract Number:: AC02-76SF00515; 2019-03935; 2018-00740

OSTI ID:: 2006432

Journal Information:: Journal of Synchrotron Radiation (Online), Vol. 30, Issue 1; ISSN 1600-5775

Publisher:: International Union of CrystallographyCopyright Statement

Country of Publication:: United States

Language:: English

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