Atomic-resolution characterization of interface structure and chemistry in the STEM
Conference
·
OSTI ID:10178342
- Oak Ridge National Lab., TN (United States)
- Northwestern Univ., Evanston, IL (United States). Dept. of Materials Science and Engineering
Combination of Z-contrast imaging and EELS (electron energy loss spectroscopy) allows the local structure and chemistry of interfaces to be determined on the atomic scale. In this paper, these two complementary techniques are used to analyze the structure and chemistry of a nominally 25 degree [100] symmetric tilt boundary in an electroceramic SrTiO{sub 3} bicrystal.
- Research Organization:
- Oak Ridge National Lab., TN (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC05-84OR21400
- OSTI ID:
- 10178342
- Report Number(s):
- CONF-940766-8; ON: DE94017753
- Resource Relation:
- Conference: 13. international congress on electron microscopy,Paris (France),17-22 Jul 1994; Other Information: PBD: Mar 1994
- Country of Publication:
- United States
- Language:
- English
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