Atomic resolution characterization of a SrTiO{sub 3} grain boundary in the STEM
Conference
·
OSTI ID:10148951
- Oak Ridge National Lab., TN (United States)
- Northwestern Univ., Evanston, IL (United States). Dept. of Materials Science and Engineering
This paper uses the complementary techniques of high resolution Z-contrast imaging and PEELS (parallel detection electron energy loss spectroscopy) to investigate the atomic structure and chemistry of a 25 degree symmetric tilt boundary in a bicrystal of the electroceramic SrTiO{sub 3}. The gain boundary is composed of two different boundary structural units which occur in about equal numbers: one which contains Ti-O columns and the other without.
- Research Organization:
- Oak Ridge National Lab., TN (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC05-84OR21400; AC05-76OR00033; FG02-92ER45475
- OSTI ID:
- 10148951
- Report Number(s):
- CONF-940753-5; ON: DE94011469; BR: KC0201010
- Resource Relation:
- Conference: Microscopy Society of America and Microbeam Analysis Society joint meeting,New Orleans, LA (United States),31 Jul - 5 Aug 1994; Other Information: PBD: Mar 1994
- Country of Publication:
- United States
- Language:
- English
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