Peak reflectivity measurements of W/C, Mo/Si, and Mo/B sub 4 C multilayer mirrors in the 8--190-A range using both K. alpha. line and synchrotron radiation

Journal Article · Sat Sep 01 00:00:00 EDT 1990 · Applied Optics; (USA)

DOI:https://doi.org/10.1364/AO.29.003694· OSTI ID:6329326

Zwicker, A P; Regan, S P; Finkenthal, M; Moos, H W ^[1]; Saloman, E B; Watts, R; Roberts, J ^[2]

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1. Johns Hopkins University, Baltimore, MD (USA)
2. U.S. National Institute of Standards Technology, Gaithersburg, MD (USA)

Peak reflectivity measurements of W/C, Mo/Si, and Mo/B{sub 4}C multilayer mirrors have been performed using line and synchrotron radiation in the 8--190-A wavelength range. Short wavelength measurements using a line source were corrected for nonmonochromatic and divergent incident radiation. Reflectivities of Mo/Si mirrors, measured with synchrotron radiation, ranged from 25 to 44% but decreased significantly around the Si absorption edge. Mo/B{sub 4}C multilayer mirrors were measured that had peak reflectivities from 10 to 25% between 90 and 200 A and bandpasses as small as 3 A. Key words: Multilayer mirrors, peak reflectivity.

• DOE Contract Number: FG02-86ER53214
• OSTI ID: 6329326
• Journal Information: Applied Optics; (USA), Vol. 29:25; ISSN 0003-6935
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
MIRRORS
REFLECTIVITY
X-RAY EQUIPMENT
BORON CARBIDES
CARBON
EXTREME ULTRAVIOLET RADIATION
MOLYBDENUM
SILICON
SOFT X RADIATION
SYNCHROTRON RADIATION
TUNGSTEN
X-RAY SPECTROMETERS
BORON COMPOUNDS
BREMSSTRAHLUNG
CARBIDES
CARBON COMPOUNDS
ELECTROMAGNETIC RADIATION
ELEMENTS
EQUIPMENT
IONIZING RADIATIONS
MEASURING INSTRUMENTS
METALS
NONMETALS
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
RADIATIONS
SEMIMETALS
SPECTROMETERS
SURFACE PROPERTIES
TRANSITION ELEMENTS
ULTRAVIOLET RADIATION
X RADIATION
440100* - Radiation Instrumentation