Spatial resolution limits for synchrotron-based spectromicroscopy in the mid- and near-infrared

Journal Article · Sat Jan 12 00:00:00 EST 2008 · Journal of Synchrotron Radiation

DOI:https://doi.org/10.1107/S0909049508004524· OSTI ID:938511

Levenson, Erika; Lerch, Philippe; Martin, Michael C

Spatial resolution tests were performed on beamline 1.4.4 at the Advanced Light Source in Berkeley, CA, USA, a third-generation synchrotron light source. This beamline couples the high-brightness synchrotron source to a Thermo-Electron Continumum XL infrared microscope. Two types of resolution tests were performed in both the mid-IR and near-IR. The results are compared with a diffraction-limited spot size theory. At shorter near-IR wavelengths the experimental results begin to deviate from diffraction-limited so a combined diffraction-limit and electron-beam-source-size model is employed. This description shows how the physical electron beam size of the synchrotron source begins to dominate the focused spot size at higher energies. The transition from diffraction-limited to electron-beam-size-limited performance is a function of storage-ring parameters and the optical demagnification within the beamline and microscope optics. The discussion includes how different facilities, beamlines and microscopes will affect the achievable spatial resolution. As synchrotron light sources and other next-generation accelerators such as energy-recovery LINACs and free-electron lasers achieve smaller beam emittances, beta-functions and/or energy spreads, diffraction-limited performance can continue to higher-energy beams, perhaps ultimately into the extreme ultraviolet.

• Research Organization: Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
• Sponsoring Organization: Advanced Light Source Division
• DOE Contract Number: DE-AC02-05CH11231
• OSTI ID: 938511
• Report Number(s): LBNL-835E; TRN: US0805969
• Journal Information: Journal of Synchrotron Radiation, Vol. 15, Issue 4; Related Information: Journal Publication Date: July 2008
• Country of Publication: United States
• Language: English

Related Subjects

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ACCELERATORS
ADVANCED LIGHT SOURCE
BEAM EMITTANCE
ELECTRON BEAMS
ENERGY RECOVERY
LASERS
LIGHT SOURCES
LINEAR ACCELERATORS
MICROSCOPES
OPTICS
PERFORMANCE
RESOLUTION
SPATIAL RESOLUTION
SYNCHROTRONS
WAVELENGTHS
infrared
resolution
microscopy
Fourier transform infrared
spectromicroscopy
imaging
diffraction
emittance
microspectroscopy
beamline.