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Title: Wavelet crosstalk matrix and its application to assessment of shift-variant imaging systems

Conference ·
OSTI ID:816215

The objective assessment of image quality is essential for design of imaging systems. Barrett and Gifford [1] introduced the Fourier cross talk matrix. Because it is diagonal for continuous linear shift-invariant imaging systems, the Fourier cross talk matrix is a powerful technique for discrete imaging systems that are close to shift invariant. However, for a system that is intrinsically shift variant, Fourier techniques are not particularly effective. Because Fourier bases have no localization property, the shift-variance of the imaging system cannot be shown by the response of individual Fourier bases; rather, it is shown in the correlation between the Fourier coefficients. This makes the analysis and optimization quite difficult. In this paper, we introduce a wavelet cross talk matrix based on wavelet series expansions. The wavelet cross talk matrix allows simultaneous study of the imaging system in both the frequency and spatial domains. Hence it is well suited for shift variant systems. We compared the wavelet cross talk matrix with the Fourier cross talk matrix for several simulated imaging systems, namely the interior and exterior tomography problems, limited angle tomography, and a rectangular geometry positron emission tomograph. The results demonstrate the advantages of the wavelet cross talk matrix in analyzing shift-variant imaging systems.

Research Organization:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
USDOE Director, Office of Science. Office of Biological and Environmental Research. Medical Sciences Division; National Institutes of Health (US)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
816215
Report Number(s):
LBNL-51931; R&D Project: 860530; TRN: US0304941
Resource Relation:
Conference: IEEE Nuclear Science Symposium and Medical Imaging Conference, Norfolk, VA (US), 11/10/2002--11/16/2002; Other Information: PBD: 1 Nov 2002
Country of Publication:
United States
Language:
English

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