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Title: Application of Micro-XRF for Nuclear Materials Characterization and Problem Solving

Conference ·

Micro-X-ray fluorescence (MXRF) used for >> 20 years To date MXRF has been underutilized for nuclear materials (NM) spatially-resolved elemental characterization. Scanning electron microscopy (SEM) with EDX much more common for NM characterization at a micro scale. But MXRF fills gap for larger 10's microns to cm{sup 2} scales. Will present four interesting NM applications using MXRF. Demonstrated unique value of MXRF for various plutonium applications. Although SEM has much higher resolution, MXRF clearly better for these larger scale samples (especially non-conducting samples). MXRF useful to quickly identify insoluble particles in Pu/Np oxide. MXRF vital to locating HEPA filter Pu particles over cm{sup 2} areas which were then extracted for SEM morphology and particle size distribution analysis. MXRF perfect for surface swipes which are far too large for practical SEM imaging, and loose residue would contaminate SEM vacuum chamber. MXRF imaging of ER Plutonium metal warrants further studies to explore metal elemental heterogeneity.

Research Organization:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
Sponsoring Organization:
DHS
DOE Contract Number:
AC52-06NA25396
OSTI ID:
1048358
Report Number(s):
LA-UR-12-23811; TRN: US1204172
Resource Relation:
Journal Volume: 28; Journal Issue: 2; Conference: Denver X-ray Conference ; 2012-08-06 - 2012-08-10 ; Denver, Colorado, United States
Country of Publication:
United States
Language:
English