The role of electronic energy loss in ion beam modification of materials

Weber, William J.; Duffy, Dorothy M.; Thome, Lionel; Zhang, Yanwen

doi:10.1016/j.cossms.2014.09.003

Title: The role of electronic energy loss in ion beam modification of materials

Journal Article · Sun Oct 05 00:00:00 EDT 2014 · Current Opinion in Solid State and Materials Science

DOI:https://doi.org/10.1016/j.cossms.2014.09.003· OSTI ID:1185640

Weber, William J. ^[1]; Duffy, Dorothy M. ^[2]; Thome, Lionel ^[3]; Zhang, Yanwen ^[1]

The Univ. of Tennessee, Knoxville, TN (United States); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
University College London, London (United Kingdom)
CNRS-IN2P3-Univ. Paris-Sud, Orsay (France)

The interaction of energetic ions with solids results in energy loss to both atomic nuclei and electrons in the solid. In this article, recent advances in understanding and modeling the additive and competitive effects of nuclear and electronic energy loss on the response of materials to ion irradiation are reviewed. Experimental methods and large-scale atomistic simulations are used to study the separate and combined effects of nuclear and electronic energy loss on ion beam modification of materials. The results demonstrate that nuclear and electronic energy loss can lead to additive effects on irradiation damage production in some materials; while in other materials, the competitive effects of electronic energy loss leads to recovery of damage induced by elastic collision cascades. Lastly, these results have significant implications for ion beam modification of materials, non-thermal recovery of ion implantation damage, and the response of materials to extreme radiation environments.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1185640

Alternate ID(s):: OSTI ID: 1251267

Journal Information:: Current Opinion in Solid State and Materials Science, Vol. 19, Issue 1; ISSN 1359-0286

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 122 works

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