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Title: Method of collecting and processing electron diffraction data

Patent ·
OSTI ID:1166756
; ; ; ;

A method of using electron diffraction to obtain PDFs from crystalline, nanocrystalline, and amorphous inorganic, organic, and organometallic compound.

Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC02-98CH10886
Assignee:
The Trustees of Columbia University in the City of New York (New York, NY)
Patent Number(s):
8,921,783
Application Number:
14/160,185
OSTI ID:
1166756
Resource Relation:
Patent File Date: 2014 Jan 21
Country of Publication:
United States
Language:
English

References (22)

Method and apparatus for measuring thermal diffusivity by ac joule-heating patent January 1992
Method of and device for determining the polymerization profile of a polymeric layer patent July 1997
Metallo organo liquid crystals in a polymer matrix patent December 1998
Field assisted transformation of chemical and material compositions patent July 2001
Electron detectors patent May 2003
Observation apparatus and observation method using an electron beam patent June 2004
Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope patent January 2006
Standard sample for transmission electron microscope (TEM) elemental mapping and TEM elemetal mapping method using the same patent May 2006
Method and device for measuring electron diffraction of a sample patent December 2011
Methods and devices for high throughput crystal structure analysis by electron diffraction patent August 2012
Pigmented cosmetic compositions patent-application July 2003
Chemical prefiltering for phase differentiation via simultaneous energy dispersive spectrometry and electron backscatter diffraction patent-application January 2004
Electron beam applying apparatus and drawing apparatus patent-application April 2007
Analysis and Screening of Solid Forms Using the Atomic Pair Distribution Function patent-application October 2007
Beam Apparatus patent-application June 2008
Methods and Apparatus for Spectroscopic Imaging of Materials in an Array patent-application January 2009
Processing Materials with Ion Beams patent-application January 2010
Apparatus and Method Including a Direct Bombardment Detector and a Secondary Detector for Use in Electron Microscopy patent-application February 2010
Scanning Transmission Electron Microscope Using Gas Amplification patent-application May 2010
Characterization of Nanoscale Structures Using an Ultrafast Electron Microscope patent-application May 2010
Method and Device for Measuring Electron Diffraction of a Sample patent-application March 2011
X-ray characterization of solid small molecule organic materials patent-application May 2011

Cited By (1)

Apparatus and method of applying small-angle electron scattering to characterize nanostructures on opaque substrate patent July 2016

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Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
47 OTHER INSTRUMENTATION