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Title: Background X-ray Spectrum of Radioactive Samples

Conference ·
OSTI ID:924507

An energy-dispersive X-ray spectrometer (EDS) is commonly used with a scanning electron microscope (SEM) to analyze the elemental compositions and microstructures of a variety of samples. For example, the microstructures of nuclear fuels are commonly investigated with this technique. However, the radioactivity of some materials introduces additional X-rays that contribute to the EDS background spectrum. These X-rays are generally not accounted for in spectral analysis software, and can cause misleading results. X-rays from internal conversion [1], Bremsstrahlung [2] radiation associated with alpha ionizations and beta particle interactions [3], and gamma rays from radioactive decay can all elevate the background of radioactive materials.

Research Organization:
Idaho National Lab. (INL), Idaho Falls, ID (United States)
Sponsoring Organization:
DOE - NE
DOE Contract Number:
DE-AC07-99ID-13727
OSTI ID:
924507
Report Number(s):
INL/CON-08-13770; TRN: US0802902
Resource Relation:
Conference: 2008 American Nuclear Society Student Conference,College Station, TX,02/28/2008,03/01/2008
Country of Publication:
United States
Language:
English