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Title: Background X-ray Spectrum of Radioactive Samples

An energy-dispersive X-ray spectrometer (EDS) is commonly used with a scanning electron microscope (SEM) to analyze the elemental compositions and microstructures of a variety of samples. For example, the microstructures of nuclear fuels are commonly investigated with this technique. However, the radioactivity of some materials introduces additional X-rays that contribute to the EDS background spectrum. These X-rays are generally not accounted for in spectral analysis software, and can cause misleading results. X-rays from internal conversion [1], Bremsstrahlung [2] radiation associated with alpha ionizations and beta particle interactions [3], and gamma rays from radioactive decay can all elevate the background of radioactive materials.
Authors:
;
Publication Date:
OSTI Identifier:
924507
Report Number(s):
INL/CON-08-13770
TRN: US0802902
DOE Contract Number:
DE-AC07-99ID-13727
Resource Type:
Conference
Resource Relation:
Conference: 2008 American Nuclear Society Student Conference,College Station, TX,02/28/2008,03/01/2008
Research Org:
Idaho National Laboratory (INL)
Sponsoring Org:
DOE - NE
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; 36 MATERIALS SCIENCE; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; BETA PARTICLES; BREMSSTRAHLUNG; DECAY; ELECTRON MICROSCOPES; INTERNAL CONVERSION; NUCLEAR FUELS; RADIATIONS; RADIOACTIVE MATERIALS; RADIOACTIVITY; X-RAY SPECTROMETERS Radioactive materials; Scanning electron microscopy; X-ray spectroscopy