Differentiation of Spores of Bacillus subtilis Grown in Different Media by Elemental Characterization using Time-of-Flight Secondary Ion Mass Spectrometry
We demonstrate the use of time of flight secondary ion mass spectrometry (ToF-SIMS) to infer the medium in which Bacillus subtilis spores were grown based on elemental signatures of the spores. Triplicate culture replicates grown in each of four different media were analyzed to obtain ToF-SIMS signatures comprised of 16 elemental intensities. The signatures were analyzed using ANOVA and principal components analysis (PCA). Confusion matrices constructed using nearest neighbor classification of the PCA scores confirmed the predictive utility of ToF-SIMS elemental signatures in identifying sporulation media. Application of this method will be of use in microbial forensics, and may also prove useful in the areas of food microbiology and astrobiology.
- Research Organization:
- Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC05-76RL01830
- OSTI ID:
- 860408
- Report Number(s):
- PNNL-SA-44084; AEMIDF; 1711a; TRN: US200524%%177
- Journal Information:
- Applied and Environmental Microbiology, Vol. 71, Issue 11; ISSN 0099-2240
- Country of Publication:
- United States
- Language:
- English
Similar Records
STUDIES ON THE RADIATION RESISTANCE OF SPORULATING CELLS OF BACILLUS SUBTILIS
High-Resolution Spore Coat Architecture and Assembly of Bacillus Spores