Experiments and analysis of lateral piezoresistance gauges
Conference
·
· AIP Conference Proceedings (American Institute of Physics); (United States)
OSTI ID:6912817
- Computational Physics Research and Development Department, Sandia National Laboratories Albuquerque, New Mexico 87185-5800 (United States)
The response of lateral piezoresistance gauges to shock wave uniaxial strain loading has been examined in a combined experimental and calculational effort. Plate impact experiments provided lateral gauge data which were analyzed using quasi-static and dynamic inclusion analyses. Experimental data showed that the response of the lateral gauge output depended upon the matrix material and gauge emplacement method. The calculations indicated that these differences were due to complex gauge-matrix interactions. These were influenced by the stress and strain distributions in and around the gauge, plasticity effects, material properties, and emplacement conditions. [copyright]American Institute of Physics
- OSTI ID:
- 6912817
- Report Number(s):
- CONF-921145-; CODEN: APCPCS
- Journal Information:
- AIP Conference Proceedings (American Institute of Physics); (United States), Vol. 309:1; Conference: Production and neutralization of negative ions and beams, Upton, NY (United States), 9-13 Nov 1992; ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
47 OTHER INSTRUMENTATION
PRESSURE GAGES
PERFORMANCE
ALUMINIUM OXIDES
COMPUTERIZED SIMULATION
ELECTRIC CONDUCTIVITY
FOILS
MANGANIN
SHOCK WAVES
SILICON OXIDES
STRESSES
YTTERBIUM
ALLOYS
ALUMINIUM COMPOUNDS
CHALCOGENIDES
COPPER ALLOYS
COPPER BASE ALLOYS
ELECTRICAL PROPERTIES
ELEMENTS
MANGANESE ALLOYS
MEASURING INSTRUMENTS
METALS
NICKEL ALLOYS
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
RARE EARTHS
SILICON COMPOUNDS
SIMULATION
440800* - Miscellaneous Instrumentation- (1990-)
PRESSURE GAGES
PERFORMANCE
ALUMINIUM OXIDES
COMPUTERIZED SIMULATION
ELECTRIC CONDUCTIVITY
FOILS
MANGANIN
SHOCK WAVES
SILICON OXIDES
STRESSES
YTTERBIUM
ALLOYS
ALUMINIUM COMPOUNDS
CHALCOGENIDES
COPPER ALLOYS
COPPER BASE ALLOYS
ELECTRICAL PROPERTIES
ELEMENTS
MANGANESE ALLOYS
MEASURING INSTRUMENTS
METALS
NICKEL ALLOYS
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
RARE EARTHS
SILICON COMPOUNDS
SIMULATION
440800* - Miscellaneous Instrumentation- (1990-)