Phase contrast hard x-ray microscopy with submicron resolution

Journal Article · Sat Nov 01 00:00:00 EST 1997 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.119324· OSTI ID:544757

Lagomarsino, S; Cedola, A ^[1]; Cloetens, P ^[2]; Di Fonzo, S; Jark, W; Soullie, G ^[3]; Riekel, C ^[4]

---

1. Istituto di Elettronica dello Stato Solido (IESS), CNR, V. Cineto Romano 42, 00156 Roma (Italy)
2. EMAT, University of Antwerp (RUCA), B-2020 Antwerp (Belgium)
3. SINCROTRONE TRIESTE, S.S.14 Km 163,5, in Area Science Park, 34012 Basovizza---Trieste (Italy)
4. European Synchrotron Radiation Facility (ESRF), B.P. 220, F-38043 Grenoble Cedex (France)

In this letter we present a hard x-ray phase contrast microscope based on the divergent and coherent beam exiting an x-ray waveguide. It uses lensless geometrical projection to magnify spatial variations in optical path length more than 700 times. Images of a nylon fiber and a gold test pattern were obtained with a resolution of 0.14 {mu}m in one direction. Exposure times as short as 0.1 s gave already visible contrast, opening the way to high resolution, real time studies. {copyright} {ital 1997 American Institute of Physics.}

• OSTI ID: 544757
• Journal Information: Applied Physics Letters, Vol. 71, Issue 18; Other Information: PBD: Nov 1997
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
HARD X RADIATION
MICROSCOPY
RESOLUTION
NYLON
FIBERS
IMAGES
WAVEGUIDES