A mass spectroscopic analysis of {gamma}-GPS films
- Univ. of Cincinnati, OH (United States)
Preparation of substrates for painting or adhesive bonding frequently includes roughening through sanding, chemical etching, or gritblasting. Increased roughness can improve interfacial strength and durability due to increased mechanical interlocking, increased surface area, and improved wettability of the substrate. The chemical reactivity of the surface with the organic phase may be affected as well, perhaps related to the strain energy stored in the surface regions through the intense plastic deformation that occurs. Unfortunately, the chemistry of interactions taking place near a surface that has been roughened is difficult to access analytically by some of the more useful techniques such as infrared spectroscopy. This paper discusses analysis of nonreflective grit-blasted surfaces using mass spectroscopy of species which were either sputtered off using an ion beam (Static Secondary Ion Mass Spectroscopy, or SSIMS) or thermally desorbed as neutrals using a pulsed laser and then post-ionized using a secondary laser (Laser Desorption-Laser Ionization Mass Spectroscopy, or LDLIMS). Both of these techniques exhibit sub-nanometer sensitivity and provide significant information as to the chemistry and structure of the surface regions. In a current application of {gamma}-glycidoxypropyltrimethoxysilane ({gamma}-GPS) for the pre-treatment of grit-blasted aluminum before adhesive bonding, certain factors related to the handling of the primer solution and to the application technique were found to significantly affect the performance of the adhesive bond under long-term aging conditions including stress and humidity. To understand why these parameters are important and to potentially improve the pretreatment process even further, the authors have been investigating how the structure and reactivity of these silane films are related to the application techniques.
- OSTI ID:
- 441523
- Report Number(s):
- CONF-960214-; TRN: 96:006556-0056
- Resource Relation:
- Conference: 19. annual meeting of the Adhesion Society, Inc, Myrtle Beach, SC (United States), 18-21 Feb 1996; Other Information: PBD: 1996; Related Information: Is Part Of Proceedings of the 19th annual meeting of the Adhesion Society; Ward, T.C. [ed.]; PB: 567 p.
- Country of Publication:
- United States
- Language:
- English
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