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Title: Probabilistic elastic-plastic fracture analysis of circumferentially cracked pipes with finite-length surface flaws

Conference ·
OSTI ID:403233
 [1]
  1. Univ. of Iowa, Iowa City, IA (United States). Dept. of Mechanical Engineering

A new probabilistic model was developed for predicting elastic-plastic fracture response of circumferentially cracked pipes with finite-length, constant-depth, internal surface flaws subject to remote bending loads. It involves engineering estimation of energy release rate, J-tearing theory for characterizing ductile fracture, and standard methods of structural reliability theory. The underlying J-estimation model is based on deformation theory of plasticity, constitutive law characterized by power law model for stress-strain curve, and an equivalence criterion incorporating reduced thickness analogy for simulating system compliance due to the presence of a crack. New equations were developed to predict J-integral and were evaluated by comparing with available finite-element results from the current literature. Both analytical and simulation methods were formulated to determine the probabilistic characteristics of J. The same methods were used later to predict the probability of crack initiation and net-section collapse as a function of the applied load. Numerical examples are provided to illustrate the proposed methodology.

OSTI ID:
403233
Report Number(s):
CONF-960706-; ISBN 0-7918-1770-9; TRN: 97:000185
Resource Relation:
Conference: American Society of Mechanical Engineers (ASME) pressure vessels and piping conference, Montreal (Canada), 21-26 Jul 1996; Other Information: PBD: 1996; Related Information: Is Part Of Fatigue and fracture -- 1996: Volume 1. PVP-Volume 323; Mehta, H.S. [ed.] [GE Nuclear Energy, San Jose, CA (United States)]; Bhandari, S. [ed.] [Framatome, Paris (France)]; Jones, D. [ed.] [Westinghouse Bettis, Pittsburgh, PA (United States)]; Rahman, S. [ed.] [Univ. of Iowa, Iowa City, IA (United States)]; Wilkowski, G. [ed.] [Battelle, Columbus, OH (United States)]; Yoon, K.K. [ed.] [Framatome Technologies, Lynchburg, VA (United States)]; PB: 412 p.
Country of Publication:
United States
Language:
English