Electron transport in {ital o}- and {ital m}-xylene under high pressure
- Department of Pure and Applied Sciences, University of Tokyo, 3-8-1 Komaba, Meguro-ku, Tokyo 153 (Japan)
- Faculty of Engineering, Kanagawa Institute of Technology, 1030 Shimo-Ogino, Atsugi 243-02 (Japan)
- Chemistry Department, Brookhaven National Laboratory, Upton, New York 11973-5000 (United States)
The electron drift mobility ({mu}) was measured by a time-of-flight method in pure liquid {ital o}- and {ital m}-xylene under high pressures up to 300 MPa, and in the temperature ranges from 15 to 120{degree}C and 0 to 100{degree}C, respectively. In both liquids {mu} increases in the lower pressure region at lower temperatures. At higher pressures {mu} decreases gradually with pressure at all temperatures studied. The pressure dependence of {mu} was interpreted in terms of a two-state model and a hopping model. When {mu} increases with pressure this interpretation leads to a positive volume change upon introduction of electrons into the liquid, showing electrons reside in cavities of radius 0.31 to 0.32 nm, whereas in the high pressure region electron attachment to xylene molecules occurs, accompanied by hopping of electrons between molecules. {copyright} {ital 1996 American Institute of Physics.}
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- DOE Contract Number:
- AC02-76CH00016
- OSTI ID:
- 383746
- Journal Information:
- Journal of Chemical Physics, Vol. 105, Issue 13; Other Information: PBD: Oct 1996
- Country of Publication:
- United States
- Language:
- English
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