Structural and electrical transport studies on CrN(001) thin films

Journal Article · Mon May 23 00:00:00 EDT 2016 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4948069· OSTI ID:22608808

Rakshit, R. K.; Basheed, G. A.; Maurya, K. K.; Gupta, Anurag ^[1]; Kumar, Dinesh; Singh, Manju ^[1]

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1. CSIR-National Physical Laboratory, Dr. K. S. Krishnan Road, New Delhi-110012 (India)

We report the structural and electrical transport studies on CrN{sub 1-x} (CrN) thin films with varying of N{sub 2} flow (5 – 25 SCCM) in an Argon environment of 25 SCCM. CrN thin films were grown at 600°C, in a multi chamber vacuum system at working pressure of 1×10{sup −2} Torr, under the base pressure of 1×10{sup −7} Torr. Structural and electrical transport measurements were carried out using X-ray diffraction (XRD), atomic force microscopy (AFM) and SQUID magnetometer, respectively. XRD (θ-2θ, ω-2θ, and ω) patterns on CrN thin films revealed a structural phase transition which is associated with the lattice parameter variation from 4.136 to 4.168 Å. The temperature dependent resistivity measurements on CrN/MgO(001) showed a clear change in slope at ≈280 K which confirms the magneto-structural transition of CrN from paramagnetic rock salt face-centered-cubic (FCC) to antiferromagnetic orthorhombic structure.

• OSTI ID: 22608808
• Journal Information: AIP Conference Proceedings, Vol. 1731, Issue 1; Conference: DAE solid state physics symposium 2015, Uttar Pradesh (India), 21-25 Dec 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANTIFERROMAGNETISM
ARGON
ATOMIC FORCE MICROSCOPY
CHROMIUM NITRIDES
CRYSTAL STRUCTURE
ELECTRIC CONDUCTIVITY
FCC LATTICES
LATTICE PARAMETERS
MAGNESIUM OXIDES
MAGNETOMETERS
ORTHORHOMBIC LATTICES
PARAMAGNETISM
PHASE TRANSFORMATIONS
SQUID DEVICES
TEMPERATURE DEPENDENCE
THIN FILMS
VACUUM SYSTEMS
X-RAY DIFFRACTION