Growing barium hexaferrite (BaFe{sub 12}O{sub 19}) thin films using chemical solution deposition

Journal Article · Tue Apr 19 00:00:00 EDT 2016 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4946923· OSTI ID:22606700

Budiawanti, Sri ^[1]; Soegijono, Bambang ^[2]

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1. Graduate Program of Materials Science, Department of Physics, FMIPA, Universitas Indonesia, Kampus UI Depok (Indonesia)
2. Multiferroic Laboratory, Department of Physics, FMIPA, Universitas Indonesia, Kampus UI Depok (Indonesia)

Barium hexaferrite (BaFe{sub 12}O{sub 19}, or simply known as BaM) thin films has been recognized as a potential candidate for microwave-based devices, magnetic recording media and data storage. To grow BaM thin films, chemical solution deposition is conducted using the aqueous solution of metal nitrates, which involves spin coatings on Si substrates. Furthermore, Thermal Gravimeter Analysis (TGA), X-Ray Diffractometer (XRD), Scanning Electron Microscopy (SEM) and Vibrating Sample Magnetometer (VSM) are applied to evaluate the decomposition behavior, structure, morphology, and magnetic properties of BaM thin films. Additionally, the effects of number of layers variation are also investigated. Finally, magnetic properties analysis indicates the isotropic nature of the films.

• OSTI ID: 22606700
• Journal Information: AIP Conference Proceedings, Vol. 1729, Issue 1; Conference: ISCPMS 2015: 1. international symposium on current progress in mathematics and sciences, Depok (Indonesia), 3-4 Nov 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
BARIUM COMPOUNDS
DECOMPOSITION
DEPOSITION
ELECTRON SCANNING
FERRITES
MAGNETIC PROPERTIES
MICROWAVE RADIATION
SCANNING ELECTRON MICROSCOPY
SPIN
SPIN-ON COATINGS
SUBSTRATES
THERMAL GRAVIMETRIC ANALYSIS
THIN FILMS
VIBRATING SAMPLE MAGNETOMETERS
X RADIATION
X-RAY DIFFRACTION
X-RAY DIFFRACTOMETERS