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Title: Investigation on onset voltage and conduction channel temperature in voltage-induced metal-insulator transition of vanadium dioxide

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.4944605· OSTI ID:22594516
; ;  [1];  [2];  [3]
  1. Department of Physics, Yonsei University, Seoul 03722 (Korea, Republic of)
  2. Division of Applied Chemistry and Biotechnology, Hanbat National University, Daejeon 34158 (Korea, Republic of)
  3. Korea, Republic of

The characteristics of onset voltages and conduction channel temperatures in the metal-insulator transition (MIT) of vanadium dioxide (VO{sub 2}) devices are investigated as a function of dimensions and ambient temperature. The MIT onset voltage varies from 18 V to 199 V as the device length increases from 5 to 80 μm at a fixed width of 100 μm. The estimated temperature at local conduction channel increases from 110 to 370 °C, which is higher than the MIT temperature (67 °C) of VO{sub 2}. A simple Joule-heating model is employed to explain voltage-induced MIT as well as to estimate temperatures of conduction channel appearing after MIT in various-sized devices. Our findings on VO{sub 2} can be applied to micro- to nano-size tunable heating devices, e.g., microscale scanning thermal cantilevers and gas sensors.

OSTI ID:
22594516
Journal Information:
Journal of Applied Physics, Vol. 119, Issue 12; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
Country of Publication:
United States
Language:
English